FIB-SEM Hybrid System XVision 200
State:
Out of stock
FIB-SEM hybrid system equipped with Hitachi High-Tech Science's latest FIB column and high performance FE-SEM, and FIB-SEM-Ar Triple Beam system equipped with ultra low kV Ar column which can handle the small sample to 200 mm wafer deliver such as high quality TEM sample preparation, Cut&See realtime high resolution obervation and 3D analysis, and EDS analysis.
Warranty: 12 tháng
Price: Contact us
Order
- Delivery time: 8h00 - 18h00 daily
- Genuine product, provided width CO, CQ
- 03 months of free warranty for consumable and accessories
- 12 months of free warranty for main equipment
- Accessorie's price is applied only when purchased with
main equipment - Contact us for any particular accessory's quotion
Email: info@redstarvietnam.com
Every day in week
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