Field Emission Scanning Electron Microscopes (FE-SEM)

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Home / Analysis & Defect Review >> Electron Microscopes (EM) >> Field Emission Scanning Electron Microscopes (FE-SEM)

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Ultra-high Resolution Scanning Electron Microscope SU9000 Contact us State: Check with us
Ultra-high Resolution Scanning Electron Microscope SU9000 Call to price Bringing the advances of SEM to the forefront Technological advances in the Semiconductor Industry are occurring at a rapid pace and pushing design and manufacturing tolerances to the nano-scale. These advances require direct observation of the surface structures of the materials at this size scale. Hitachi has a proven track record for providing cutting edge instrumentation that are reliable and that meet the strict imaging requirements of the Semiconductor Industry. Hitachi has now introduced a new line of instruments with improved CFE gun technologies that further reduce the already low aberration artifacts of existing Hitachi CFE technology. The new CFE Gun technology featured in the SU9000 achieves the highest SEM resolution in the world. (0.4nm at 30kV) The reduced aberration effects make high resolution, low accelerating voltage observations possible for beam sensitive materials without the need for deceleration technology. (1.2nm at 1kV ) The SU9000 also features STEM (option) performance that guarantees 0.34nm resolution as confi rmed through the imaging of graphite lattice ( (002) d=0.34nm) Hitachi is bringing superior fundamental performance such as stable operation, high throughput, and high resolution to the forefront of technology. *1：The world highest resolution featured in the SU9000: *2：30kV acceleration voltage condition, has been implemented as of April, 2011
Ultra-high Resolution Scanning Electron Microscope SU8200 Series Contact us State: In stock
Ultra-high Resolution Scanning Electron Microscope SU8200 Series Call to price Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi patented "Mild flashing" technique and a new vacuum system which greatly minimizes gas molecule deposition on the emitter tip. The emitter always operates in a "clean" state, and emission current and beam stability are significantly improved. The result is the ultimate SEM electron source offering high S/N, stability, and uncompromising resolution performance at low acceleration voltages. Further, these enhanced performance capabilities open a new gateway for low voltage elemental microanalysis. SU8200 system features include a new top detector filtering system for enhanced electron detection specificity. Fine contrast differentiation is now achieved by selectively filtering inelastic scattering electrons and directly detecting specific energy back scattered electrons. This selective filtering is particularly powerful for enhancing material contrast at low acceleration voltages. Vibration control measures for the stage and chamber, and optimization of the optical system contribute to the high resolution system performance of 0.8 nm at 15 kV and 1.1 nm at 1 kV.
Ultra-high Resolution Scanning Electron Microscope SU8010 Contact us State: In stock
Ultra-high Resolution Scanning Electron Microscope SU8010 Call to price Powerful lineup for ultra high resolution microscopy. Nanotechnology tool, such as semiconductors, electronics, catalysis and other functional materials, biotechnology and pharmaceuticals are being researched world-wide as core competencies for next generation cutting-edge technologies. Ultra High Resolution FE-SEM has grown to be an indispensable tool to observe the fine surface structure of materials in a wide range of nanotechnology fields. Hitachi High-Tech has newly developed the SU8010 Series to fulfill tomorrow,s market needs. The new SU8000 Series has excellent imaging performance in common, and off ers a variety of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.