Scanning Electron Microscopes (SEM)

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Home / Analysis & Defect Review >> Electron Microscopes (EM) >> Scanning Electron Microscopes (SEM)

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Hitachi Scanning Electron Microscope SU3500 Contact us State: In stock
Hitachi Scanning Electron Microscope SU3500 Call to price A New Dimension in Image Quality The completely new SU3500 SEM features novel and innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 SEM will be the workhorse microscope in any laboratory.
Scanning Electron Microscope SU1510 Contact us State: In stock
Scanning Electron Microscope SU1510 Call to price The SU1510 is a medium size chamber Variable Pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly improves low voltage performance and increases beam current well suited for today's SDD X-ray detectors. Dual high-take-off ports accommodate two EDS detectors mounted 180 degrees apart for tice the analytical data collection plus eliminates X-ray map shadows associated with rough sample surfaces. A high speed, clean, efficient TMP eliminates the need for water cooling. Compact, high performance and easy to use makes the SU1510 a great general purpose VPSEM for any advanced laboratory.
Scanning Electron Microscope S-3700N Contact us State: Check with us
Scanning Electron Microscope S-3700N Call to price The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic research, but also in various industries. Associated with this trend, samples requiring observation and analysis also cover a wide spectrum of applications from one to another. The S-3700N has been developed with these widely diversified applications in mind. In its standard configuration it comes with a secondary electron detector, a five-segment backscattered electron (BSE) detector and a variable pressure (VP) mode. This allows observation of most samples in their natural state, or wet condition, without the need for metal coating which had in the past been required for conventional SEM. The S-3700N has a huge sample chamber and can accommodate samples as large as 300 mm in diameter and 110 mm high. It has many accessory ports for the wide range of applications today's microscopists require. These accessories include EDX, WDX, EBSD, Chamber scope,cooling stage and so on. This versatile and flexible system will deal with your needs well into the future.