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Ultra-high Resolution Scanning Electron Microscope SU8010
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Ultra-high Resolution Scanning Electron Microscope SU8010
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Powerful lineup for ultra high resolution microscopy.
Nanotechnology tool, such as semiconductors, electronics, catalysis and other functional materials, biotechnology and pharmaceuticals are being researched world-wide as core competencies for next generation cutting-edge technologies. Ultra High Resolution FE-SEM has grown to be an indispensable tool to observe the fine surface structure of materials in a wide range of nanotechnology fields. Hitachi High-Tech has newly developed the SU8010 Series to fulfill tomorrow,s market needs. The new SU8000 Series has excellent imaging performance in common, and off ers a variety of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.
Schottky Field Emission Scanning Electron Microscope SU5000
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Schottky Field Emission Scanning Electron Microscope SU5000
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With a New User Interface, Provides High-quality Images for Every User
A scanning electron microscope is a tool that can be used in a wide variety of fields such as nanotechnology, materials, medicine and life sciences. Recently, although there have been marked developments in the functions and capabilities of the scanning electron microscope, the types of users are also expanding and so there is demand for a microscope that can acquire data by using these functions and capabilities independent of the user's level of skill. Furthermore, there is now also a diversification in the types of observation samples, and as a result there are increasing needs for microscopes that allow observations to be made with as few limitations as possible as regards such aspects as sample size and characteristics.
Scanning Electron Microscope S-3700N
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Scanning Electron Microscope S-3700N
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The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic research, but also in various industries. Associated with this trend, samples requiring observation and analysis also cover a wide spectrum of applications from one to another. The S-3700N has been developed with these widely diversified applications in mind. In its standard configuration it comes with a secondary electron detector, a five-segment backscattered electron (BSE) detector and a variable pressure (VP) mode. This allows observation of most samples in their natural state, or wet condition, without the need for metal coating which had in the past been required for conventional SEM. The S-3700N has a huge sample chamber and can accommodate samples as large as 300 mm in diameter and 110 mm high. It has many accessory ports for the wide range of applications today's microscopists require. These accessories include EDX, WDX, EBSD, Chamber scope,cooling stage and so on. This versatile and flexible system will deal with your needs well into the future.
[VN] Micro-sampling system
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[VN] Micro-sampling system
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[VN] Enables high-throughput analysis
A micro-sampling method (patented in Japan and the U.S.) was developed as a tool for analyzing semiconductor devices which are moving rapidly toward smaller scales. It takes about 1 hour from picking up a micro-sample to analyzing it by STEM. The position accuracy is under 0.1 µm.
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Scanning Electron Microscope S-3400N
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Scanning Electron Microscope S-3400N
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The new Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily, and/or non-conductive samples without metal coating or other complicated specimen preparation techniques.
New hardware and software functions have been developed after listening to our user's requests for better imaging, larger sample sizes, analytical capabilities,higher throughput and easy to use.
Better electron optics, larger specimen chamber, faster, cleaner evacuation system and fully automated software are just a few of the new features of the S-3400N. Due to a newly designed TMP evacuation system, no cooling water is necessary. It takes less than 100 seconds to exchange a specimen and 6 minutes to reach ready status from a cold start. It requires only 2.0 kVA for the power supply. The S-3400N will be a new world standard in the middle class Variable Pressure SEM.
[VN] 3D analysis holder
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[VN] 3D analysis holder
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[VN] This is a sample rotation holder commonly usable for FIB and STEM in order to observe a micro-sample processed in the shape of a pillar with an FIB system. It is effectively usable for 3-dimensional structural evaluation of electronic devices under miniaturization and for stereoscopic failure analysis.
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Analytical UHR Schottky Emission Scanning Electron ...
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Analytical UHR Schottky Emission Scanning Electron Microscope SU-70
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The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with ultra high resolution required for a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today' s demanding applications for research and development and multidiscipline studies.
A large specimen stage and analytical chamber accommodate a wide variety of analytical instrumentation such as EDS*, WDS*, EBSP*, CL*, STEM, and e-Beam Lithography techniques optimized for simultaneous analysis.
The SU-70 Analytical FESEM continues the tradition of industry leading technology with the quality and reliability of Hitachi products and services recognized throughout the industry.
*Option
Field Emission Transmission Electron Microscope HF5000
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Field Emission Transmission Electron Microscope HF5000
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Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance
0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration.
The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
Integrating these accumulated technologies into a new 200 kV TEM/STEM platform results in an instrument with an optimum combination of sub-Å imaging and analysis, as well as the flexibility and unique capabilities to address the most advanced studies.
Ultra-High-Resolution Schottky Scanning Electron ...
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Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000
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SU7000: The Next-Generation FE-SEM
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy.
Experience the nano-world with the SU7000!
Scanning Electron Microscopes SU3800/SU3900
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Scanning Electron Microscopes SU3800/SU3900
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Performance & Power in a Flexible Platform
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
Tabletop Microscopes Hitachi TM4000 II / TM4000Plus II
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Tabletop Microscopes Hitachi TM4000 II / TM4000Plus II
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This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 II and TM4000Plus II.
AZtecLiveOne Software with Xplore EDS detector for SEM
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AZtecLiveOne Software with Xplore EDS detector for SEM
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The AZtecLiveOne system combines the simple-to-use yet powerful AZtecLiveOne software and the proven stability and accuracy of the Xplore EDS detector.
AZtecLiveLite Software with Xplore EDS detector for SEM
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AZtecLiveLite Software with Xplore EDS detector for SEM
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AZtecLiveLite with Xplore is a system solution that takes the EDS technique from the static to the dynamic with real-time chemical analysis.
AZtecOne Software with Xplore 15 EDS detector for SEM
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AZtecOne Software with Xplore 15 EDS detector for SEM
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The AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of 15mm2 Xplore EDS detector.
Transmission Electron Microscope HT7800 Series
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Transmission Electron Microscope HT7800 Series
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The NEXT Generation of Innovation. Meeting and Exceeding Needs and Requirements in Many Fields.
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high resolution.
This breakthrough in advanced innovative design allows for highly efficient workflows and many specialized applications. It represents the cutting-edge solution for modern TEM analyses.
Ultra-high Resolution Scanning Electron Microscope ...
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Ultra-high Resolution Scanning Electron Microscope Regulus Series
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As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform.
With optimized electron optical systems, the new Regulus series features resolutions down to 0.9 nm in the Regulus8220/8230/8240 models and 1.1 nm in the Regulus8100 model—an improvement of roughly 20% in resolution at 1 kV landing voltage compared with previous models.
The Regulus series employs a novel cold-field-emission (CFE) gun optimized for high-resolution imaging at low accelerating voltages. This CFE gun makes it possible to magnify high-resolution images up to 2 million times,*1 compared with 1 million times in previous models.
User-support functions have also been enhanced so that the advanced performance of the series can be fully leveraged, including functions to assist the operation of the signal detection system for analyzing diverse types of materials, as well as device-maintenance functions.
*1 Only in Regulus8220/8230/8240
Tabletop Microscopes TM4000/TM4000Plus
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Tabletop Microscopes TM4000/TM4000Plus
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The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 and TM4000Plus.
QUANTAX 80
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QUANTAX 80
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QUANTAX 80 is a new EDS system specially designed for the Hitachi FlexSEM1000 Microscope.
QUANTAX 80 consists of a XFlash® silicon drift detector (SDD) with the best
energy resolution in its field, a small electronics unit and an easy-to-use
ESPRIT Compact software.
QUANTAX 75
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QUANTAX 75
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QUANTAX 75 is a new EDS system specially designed for the Hitachi TM3030 Tabletop Microscope.
QUANTAX 75 consists of a XFlash® silicon drift detector (SDD) with the best
energy resolution in its field, a small electronics unit and an easy-to-use
ESPRIT Compact software.
Energy Dispersive X-Ray Spectrometers - AZtecOne / ...
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Energy Dispersive X-Ray Spectrometers - AZtecOne / AZtecOneGO
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The AZtecOne system combines the simple-to-use yet powerful software and the proven stability and accuracy of a Silicon Drift Detector.
*Typical Configration TM3030Plus with AZtecOne
*Built-in EDX detector
(Manufactured for Hitachi High-Technologies Corporation by Oxford Instruments NanoAnalysis)
Scanning Electron Microscope FlexSEM 1000
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Scanning Electron Microscope FlexSEM 1000
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The FlexSEM 1000 is a compact variable-pressure SEM that delivers the performance of a conventional SEM in a lab-friendly footprint, and requires only a standard wall outlet for power.
The FlexSEM will change your view of electron microscopy!
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