Red Star Vietnam Co., Ltd.
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Field Emission Transmission Electron Microscope HF-3300

State: Out of stock
•Cold field emission electron source benefits nanoscale analysis with its high brightness and high energy resolution. Its inherent high coherency greatly contributes to ultrahigh resolution imaging and electron holography*.300kV accelerating voltage

•300kV accelerating voltage allows atomic resolution imaging for thick specimens. Metals and ceramics with high atomic numbers are less electron transparent and often need to be observed at 300kV accelerating voltage.Unique analytical capabilities

•Newly introduced spatially resolved EELS* and in situ SEM/TEM imaging* nanobeam electron diffraction provide sophisticated and unique analytical capabilities.Holder linkage with FIB system*

•Hitachi FIB-compatible specimen holder* requires no tweezer handling of TEM grid between FIB fabrication and TEM observation and ensures high sample throughput TEM analysis. Hitachi's unique specimen rotation holder* enables real-time multidirectional structural analysis together with STEM unit*.User-friendly operation

•Windows-based TEM/STEM* computer control, motor-driven movable aperture, and 5-axis motor stage make the high-end TEM more easily to access, 10 minutes high voltage ready and one minute specimen exchange result in high sample throughput for TEM analysis.
Warranty: No warranty infomation


Price: Contact us




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  • Delivery time: 8h00 - 18h00 daily
  • Genuine product, provided width CO, CQ
  • 03 months of free warranty for consumable and accessories
  • 12 months of free warranty for main equipment
  • Accessorie's price is applied only when purchased with
    main equipment
  • Contact us for any particular accessory's quotion
Email: info@redstarvietnam.com Every day in week

High brightness Cold Field Emission (Cold FE) electron source

 

Cold field emission electron source benefits nanoscale analysis with its high brightness and high energy resolution. Its inherent high coherency greatly contributes to ultrahigh resolution imaging and electron holography*.

 

300kV accelerating voltage

 

300kV accelerating voltage allows atomic resolution imaging for thick specimens. Metals and ceramics with high atomic numbers are less electron transparent and often need to be observed at 300kV accelerating voltage.

 

Unique analytical capabilities

 

Newly introduced spatially resolved EELS* and in situ SEM/TEM imaging* nanobeam electron diffraction provide sophisticated and unique analytical capabilities.

 

Holder linkage with FIB system*

 

Hitachi FIB-compatible specimen holder* requires no tweezer handling of TEM grid between FIB fabrication and TEM observation and ensures high sample throughput TEM analysis. Hitachi's unique specimen rotation holder* enables real-time multidirectional structural analysis together with STEM unit*.

 

User-friendly operation

 

Windows-based TEM/STEM* computer control, motor-driven movable aperture, and 5-axis motor stage make the high-end TEM more easily to access, 10 minutes high voltage ready and one minute specimen exchange result in high sample throughput for TEM analysis.

 

*: Optional accessory

*: Windows is a registered trademark of Microsoft Corp., in the U.S. and other countries.

 

Items

Description

Electron source

W(310) cold field emission electron source

Accelerating voltage

300 kV, 200 kV*2, 100 kV*2

Resolution

Lattice

0.10 nm

Point-to-point

0.19 nm

Information limit

0.13 nm

Magnification

Low Mag mode

200 - 500×

High Mag mode

2,000 - 1,500,000×

Image rotation

±5° or less (High Mag mode, below 1,000,000×)

Specimen tilt

±15°

Camera length

300 - 3,000 mm

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