Hitachi High-Tech Corporation
Hitachi High-Tech offers a range of advanced microscopes, including electron and atomic force microscopes. These products are utilized for observing microstructures and analyzing surfaces at the nanoscale.
Electron Microscopes use electron beam which has shorter wavelength than light to resolve fine structure considered too small for light microscopes. They are used in a wide variety of fields from
FIB is used to observe surface structure by detecting electrons generated upon ion beam irradiation and process the surface of a sample to an arbitrary shape by the use of focused ion beam.
Innovative Atomic Force Microscopy (AFM) products offering extraordinary levels of performance, value, and ease-of-use for a wide range of application from surface topography to a wide variety of nanoscale surface
Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.